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CMOS Technology Characterization for analog/RF application

Detalles Bibliográficos
Autor principal:	Seebacher, Ehrenfried
Lenguaje:	eng
Publicado:	CERN 2005
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.5170/CERN-2005-011.33 http://cds.cern.ch/record/920017

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