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Printed Circuits Manufacturing Out of Standards
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
CERN
2005
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.5170/CERN-2005-011.76 http://cds.cern.ch/record/920132 |
_version_ | 1780909292909494272 |
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author | Vasey, François |
author_facet | Vasey, François |
author_sort | Vasey, François |
collection | CERN |
id | cern-920132 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2005 |
publisher | CERN |
record_format | invenio |
spelling | cern-9201322019-09-30T06:29:59Zdoi:10.5170/CERN-2005-011.76http://cds.cern.ch/record/920132engVasey, FrançoisPrinted Circuits Manufacturing Out of StandardsDetectors and Experimental TechniquesCERNoai:cds.cern.ch:9201322005 |
spellingShingle | Detectors and Experimental Techniques Vasey, François Printed Circuits Manufacturing Out of Standards |
title | Printed Circuits Manufacturing Out of Standards |
title_full | Printed Circuits Manufacturing Out of Standards |
title_fullStr | Printed Circuits Manufacturing Out of Standards |
title_full_unstemmed | Printed Circuits Manufacturing Out of Standards |
title_short | Printed Circuits Manufacturing Out of Standards |
title_sort | printed circuits manufacturing out of standards |
topic | Detectors and Experimental Techniques |
url | https://dx.doi.org/10.5170/CERN-2005-011.76 http://cds.cern.ch/record/920132 |
work_keys_str_mv | AT vaseyfrancois printedcircuitsmanufacturingoutofstandards |