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Annealing Studies of magnetic Czochralski silicon radiation detectors

Silicon wafers grown by the Magnetic Czochralski (MCZ) method have been processed in form of pad diodes at Instituto de Microelectrónica de Barcelona (IMB-CNM) facilities. The n-type MCZ wafers were manufactured by Okmetic and they have a nominal resistivity of 1 kΩ cm. Diodes were characterized by...

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Detalles Bibliográficos
Autores principales:	Pellegrini, G, Campabadal, F, Fleta, C, Lozano, M, Rafí, J M, Ullán, M
Lenguaje:	eng
Publicado:	2005
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.1016/j.nima.2005.06.002 http://cds.cern.ch/record/921714

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