Diagnostics of the Muon System Front-end Electronics during the LHCb Experiment

This document describes a method to diagnose the Muon on-detector Front-End Electronics (FEE) during the LHCb experiment by means of threshold scan and noise rate analysis. The method does not make use of charge injection and it shows correct operation even with high voltage applied to chambers. Th...

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Detalles Bibliográficos
Autores principales: Bocci, Valerio, Kashchuk, Anatoly, Massafferri, A, Nobrega, Rafael, Schmidt, Burkhard
Lenguaje:eng
Publicado: CERN 2005
Materias:
Other Fields of Physics
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.5170/CERN-2005-011.426
http://cds.cern.ch/record/922715
Descripción
Sumario:This document describes a method to diagnose the Muon on-detector Front-End Electronics (FEE) during the LHCb experiment by means of threshold scan and noise rate analysis. The method does not make use of charge injection and it shows correct operation even with high voltage applied to chambers. The proposed technique can be used by the LHCb Muon Control System to provide alarm signals when parameters are out of specifications. Results and statistics obtained at CERN and INFN laboratories will be presented later on.

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