Diagnostics of the Muon System Front-end Electronics during the LHCb Experiment

This document describes a method to diagnose the Muon on-detector Front-End Electronics (FEE) during the LHCb experiment by means of threshold scan and noise rate analysis. The method does not make use of charge injection and it shows correct operation even with high voltage applied to chambers. Th...

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Detalles Bibliográficos
Autores principales: Bocci, Valerio, Kashchuk, Anatoly, Massafferri, A, Nobrega, Rafael, Schmidt, Burkhard
Lenguaje:eng
Publicado: CERN 2005
Materias:
Other Fields of Physics
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.5170/CERN-2005-011.426
http://cds.cern.ch/record/922715
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author Bocci, Valerio
Kashchuk, Anatoly
Massafferri, A
Nobrega, Rafael
Schmidt, Burkhard
author_facet Bocci, Valerio
Kashchuk, Anatoly
Massafferri, A
Nobrega, Rafael
Schmidt, Burkhard
author_sort Bocci, Valerio
collection CERN
description This document describes a method to diagnose the Muon on-detector Front-End Electronics (FEE) during the LHCb experiment by means of threshold scan and noise rate analysis. The method does not make use of charge injection and it shows correct operation even with high voltage applied to chambers. The proposed technique can be used by the LHCb Muon Control System to provide alarm signals when parameters are out of specifications. Results and statistics obtained at CERN and INFN laboratories will be presented later on.
id cern-922715
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2005
publisher CERN
record_format invenio
spelling cern-9227152019-09-30T06:29:59Zdoi:10.5170/CERN-2005-011.426http://cds.cern.ch/record/922715engBocci, ValerioKashchuk, AnatolyMassafferri, ANobrega, RafaelSchmidt, BurkhardDiagnostics of the Muon System Front-end Electronics during the LHCb ExperimentOther Fields of PhysicsDetectors and Experimental TechniquesThis document describes a method to diagnose the Muon on-detector Front-End Electronics (FEE) during the LHCb experiment by means of threshold scan and noise rate analysis. The method does not make use of charge injection and it shows correct operation even with high voltage applied to chambers. The proposed technique can be used by the LHCb Muon Control System to provide alarm signals when parameters are out of specifications. Results and statistics obtained at CERN and INFN laboratories will be presented later on.CERNLHCb-PROC-2005-026CERN-LHCb-PROC-2005-026oai:cds.cern.ch:9227152005-09-12
spellingShingle Other Fields of Physics
Detectors and Experimental Techniques
Bocci, Valerio
Kashchuk, Anatoly
Massafferri, A
Nobrega, Rafael
Schmidt, Burkhard
Diagnostics of the Muon System Front-end Electronics during the LHCb Experiment
title Diagnostics of the Muon System Front-end Electronics during the LHCb Experiment
title_full Diagnostics of the Muon System Front-end Electronics during the LHCb Experiment
title_fullStr Diagnostics of the Muon System Front-end Electronics during the LHCb Experiment
title_full_unstemmed Diagnostics of the Muon System Front-end Electronics during the LHCb Experiment
title_short Diagnostics of the Muon System Front-end Electronics during the LHCb Experiment
title_sort diagnostics of the muon system front-end electronics during the lhcb experiment
topic Other Fields of Physics
Detectors and Experimental Techniques
url https://dx.doi.org/10.5170/CERN-2005-011.426
http://cds.cern.ch/record/922715
work_keys_str_mv AT boccivalerio diagnosticsofthemuonsystemfrontendelectronicsduringthelhcbexperiment
AT kashchukanatoly diagnosticsofthemuonsystemfrontendelectronicsduringthelhcbexperiment
AT massafferria diagnosticsofthemuonsystemfrontendelectronicsduringthelhcbexperiment
AT nobregarafael diagnosticsofthemuonsystemfrontendelectronicsduringthelhcbexperiment
AT schmidtburkhard diagnosticsofthemuonsystemfrontendelectronicsduringthelhcbexperiment

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