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Diffusive, structural, optical, and electrical properties of defects in semiconductors

Detalles Bibliográficos
Autores principales: Deicher, M, Johnston, K, Bollmann, J, Henry, M, Kronenberg, J, Thieme, M, Türker, M, Weber, J, Wichert, T, Wolf, H
Lenguaje:eng
Publicado: 2006
Materias:
Acceso en línea:http://cds.cern.ch/record/922754
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author Deicher, M
Johnston, K
Bollmann, J
Henry, M
Kronenberg, J
Thieme, M
Türker, M
Weber, J
Wichert, T
Wolf, H
author_facet Deicher, M
Johnston, K
Bollmann, J
Henry, M
Kronenberg, J
Thieme, M
Türker, M
Weber, J
Wichert, T
Wolf, H
author_sort Deicher, M
collection CERN
id cern-922754
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2006
record_format invenio
spelling cern-9227542019-09-30T06:29:59Zhttp://cds.cern.ch/record/922754engDeicher, MJohnston, KBollmann, JHenry, MKronenberg, JThieme, MTürker, MWeber, JWichert, TWolf, HDiffusive, structural, optical, and electrical properties of defects in semiconductorsDetectors and Experimental TechniquesCERN-INTC-2006-004INTC-P-202oai:cds.cern.ch:9227542006-01-01
spellingShingle Detectors and Experimental Techniques
Deicher, M
Johnston, K
Bollmann, J
Henry, M
Kronenberg, J
Thieme, M
Türker, M
Weber, J
Wichert, T
Wolf, H
Diffusive, structural, optical, and electrical properties of defects in semiconductors
title Diffusive, structural, optical, and electrical properties of defects in semiconductors
title_full Diffusive, structural, optical, and electrical properties of defects in semiconductors
title_fullStr Diffusive, structural, optical, and electrical properties of defects in semiconductors
title_full_unstemmed Diffusive, structural, optical, and electrical properties of defects in semiconductors
title_short Diffusive, structural, optical, and electrical properties of defects in semiconductors
title_sort diffusive, structural, optical, and electrical properties of defects in semiconductors
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/922754
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