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Diffusive, structural, optical, and electrical properties of defects in semiconductors
Autores principales: | , , , , , , , , , |
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Lenguaje: | eng |
Publicado: |
2006
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/922754 |
_version_ | 1780909352278818816 |
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author | Deicher, M Johnston, K Bollmann, J Henry, M Kronenberg, J Thieme, M Türker, M Weber, J Wichert, T Wolf, H |
author_facet | Deicher, M Johnston, K Bollmann, J Henry, M Kronenberg, J Thieme, M Türker, M Weber, J Wichert, T Wolf, H |
author_sort | Deicher, M |
collection | CERN |
id | cern-922754 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2006 |
record_format | invenio |
spelling | cern-9227542019-09-30T06:29:59Zhttp://cds.cern.ch/record/922754engDeicher, MJohnston, KBollmann, JHenry, MKronenberg, JThieme, MTürker, MWeber, JWichert, TWolf, HDiffusive, structural, optical, and electrical properties of defects in semiconductorsDetectors and Experimental TechniquesCERN-INTC-2006-004INTC-P-202oai:cds.cern.ch:9227542006-01-01 |
spellingShingle | Detectors and Experimental Techniques Deicher, M Johnston, K Bollmann, J Henry, M Kronenberg, J Thieme, M Türker, M Weber, J Wichert, T Wolf, H Diffusive, structural, optical, and electrical properties of defects in semiconductors |
title | Diffusive, structural, optical, and electrical properties of defects in semiconductors |
title_full | Diffusive, structural, optical, and electrical properties of defects in semiconductors |
title_fullStr | Diffusive, structural, optical, and electrical properties of defects in semiconductors |
title_full_unstemmed | Diffusive, structural, optical, and electrical properties of defects in semiconductors |
title_short | Diffusive, structural, optical, and electrical properties of defects in semiconductors |
title_sort | diffusive, structural, optical, and electrical properties of defects in semiconductors |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/922754 |
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