Diffusive, structural, optical, and electrical properties of defects in semiconductors

Detalles Bibliográficos
Autores principales: Deicher, M, Johnston, K, Bollmann, J, Henry, M, Kronenberg, J, Thieme, M, Türker, M, Weber, J, Wichert, T, Wolf, H
Lenguaje:eng
Publicado: 2006
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/922754

Internet

http://cds.cern.ch/record/922754

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