Cargando…

Operation of heavily irradiated silicon detectors in non-depletion mode

The non-depletion detector operation mode has generally been disregarded as an option in high-energy physics experiments. In this paper, the non-depletion operation is examined by detailed analysis of the electric field distribution and the current pulse response of heavily irradiated silicon (Si) d...

Descripción completa

Detalles Bibliográficos
Autores principales: Verbitskaya, E, Eremin, V, Ilyashenko, Yu S, Li, Z, Härkönen, J, Tuovinen, E, Luukka, Panja
Lenguaje:eng
Publicado: 2006
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2005.10.126
http://cds.cern.ch/record/927719
Descripción
Sumario:The non-depletion detector operation mode has generally been disregarded as an option in high-energy physics experiments. In this paper, the non-depletion operation is examined by detailed analysis of the electric field distribution and the current pulse response of heavily irradiated silicon (Si) detectors. The previously reported model of double junction in heavily irradiated Si detector is further developed and a simulation of the current pulse response has been performed. It is shown that detectors can operate in a non-depletion mode due to the fact that the value of the electric field in a non-depleted region is high enough for efficient carrier drift. This electric field originates from the current flow through the detector and a consequent drop of the potential across high-resistivity bulk of a non-depleted region. It is anticipated that the electric field in a non-depleted region, which is still electrically neutral, increases with fluence that improves the non-depleted detector operation. Consideration of the electric field in a non-depleted region allows the explanation of the recorded double-peak current pulse shape of heavily irradiated Si detectors and definition of the requirements for the detector operational conditions. Detailed reconstruction of the electric field distribution gives new information on radiation effects in Si detectors.