Cargando…

MAPMT Ageing Tests for High-Intensity Incident Lights and High Voltage Switching

Detalles Bibliográficos
Autor principal: Inoue, N
Lenguaje:eng
Publicado: 2005
Materias:
Acceso en línea:http://cds.cern.ch/record/965890
_version_ 1780910368589086720
author Inoue, N
author_facet Inoue, N
author_sort Inoue, N
collection CERN
id cern-965890
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2005
record_format invenio
spelling cern-9658902019-09-30T06:29:59Zhttp://cds.cern.ch/record/965890engInoue, NMAPMT Ageing Tests for High-Intensity Incident Lights and High Voltage SwitchingAstrophysics and Astronomyoai:cds.cern.ch:9658902005
spellingShingle Astrophysics and Astronomy
Inoue, N
MAPMT Ageing Tests for High-Intensity Incident Lights and High Voltage Switching
title MAPMT Ageing Tests for High-Intensity Incident Lights and High Voltage Switching
title_full MAPMT Ageing Tests for High-Intensity Incident Lights and High Voltage Switching
title_fullStr MAPMT Ageing Tests for High-Intensity Incident Lights and High Voltage Switching
title_full_unstemmed MAPMT Ageing Tests for High-Intensity Incident Lights and High Voltage Switching
title_short MAPMT Ageing Tests for High-Intensity Incident Lights and High Voltage Switching
title_sort mapmt ageing tests for high-intensity incident lights and high voltage switching
topic Astrophysics and Astronomy
url http://cds.cern.ch/record/965890
work_keys_str_mv AT inouen mapmtageingtestsforhighintensityincidentlightsandhighvoltageswitching