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Monitor of SC beam profiles
A high-resolution secondary emission grid for the measurement of SC beam profiles. Modern techniques of metal-ceramic bonding, developed for micro-electronics, have been used in its construction. (See Annual Report 1977 p. 105 Fig. 12.)
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| Publicado: |
1977
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| Acceso en línea: | http://cds.cern.ch/record/969131 |