Temperature Behaviour and Uniformity of SCT Barrels during Assembly and Reception Testing

This note presents temperature studies of the barrel SemiConductor Tracker (SCT) modules during the barrel assembly at Oxford University and the barrel reception at CERN. At Oxford, warm and/or cold tests have been performed on each of the four SCT barrels comprising a total of 2112 silicon strip modules. After macro-assembly, the barrels were shipped to CERN where reception tests took place before the inner detector integration phase. We present the temperature uniformity of the different barrels under changing operating conditions. Estimates of the errors contributing to the temperature measurements will be discussed. We introduce corrections for several systematic effects. We finally identify modules operating at higher temperatures and discuss possible reasons for their deteriorated thermal performance.