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5th Symposium on Reliability in Electronics
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
Omikk-Technoinform
1982
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/98574 |
_version_ | 1780876070016253952 |
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author | Collective |
author_facet | Collective |
author_sort | Collective |
collection | CERN |
id | cern-98574 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1982 |
publisher | Omikk-Technoinform |
record_format | invenio |
spelling | cern-985742021-04-22T22:12:43Zhttp://cds.cern.ch/record/98574engCollective5th Symposium on Reliability in Electronics5th Symposium on Reliability in ElectronicsEngineeringOmikk-Technoinformoai:cds.cern.ch:985741982 |
spellingShingle | Engineering Collective 5th Symposium on Reliability in Electronics |
title | 5th Symposium on Reliability in Electronics |
title_full | 5th Symposium on Reliability in Electronics |
title_fullStr | 5th Symposium on Reliability in Electronics |
title_full_unstemmed | 5th Symposium on Reliability in Electronics |
title_short | 5th Symposium on Reliability in Electronics |
title_sort | 5th symposium on reliability in electronics |
topic | Engineering |
url | http://cds.cern.ch/record/98574 |
work_keys_str_mv | AT collective 5thsymposiumonreliabilityinelectronics |