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5th Symposium on Reliability in Electronics
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Omikk-Technoinform
1982
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/98575 |
| _version_ | 1780876070228066304 |
|---|---|
| author | Collective |
| author_facet | Collective |
| author_sort | Collective |
| collection | CERN |
| id | cern-98575 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1982 |
| publisher | Omikk-Technoinform |
| record_format | invenio |
| spelling | cern-985752021-04-22T22:12:43Zhttp://cds.cern.ch/record/98575engCollective5th Symposium on Reliability in Electronics5th Symposium on Reliability in ElectronicsEngineeringOmikk-Technoinformoai:cds.cern.ch:985751982 |
| spellingShingle | Engineering Collective 5th Symposium on Reliability in Electronics |
| title | 5th Symposium on Reliability in Electronics |
| title_full | 5th Symposium on Reliability in Electronics |
| title_fullStr | 5th Symposium on Reliability in Electronics |
| title_full_unstemmed | 5th Symposium on Reliability in Electronics |
| title_short | 5th Symposium on Reliability in Electronics |
| title_sort | 5th symposium on reliability in electronics |
| topic | Engineering |
| url | http://cds.cern.ch/record/98575 |
| work_keys_str_mv | AT collective 5thsymposiumonreliabilityinelectronics |