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Characterization of High Tc Materials and Devices by Electron Microscopy
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
Cambridge Univ. Press
2000
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/992185 |
| _version_ | 1780911399799619584 |
|---|---|
| author | Browning, Nigel D Pennycook, Stephen J |
| author_facet | Browning, Nigel D Pennycook, Stephen J |
| author_sort | Browning, Nigel D |
| collection | CERN |
| id | cern-992185 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2000 |
| publisher | Cambridge Univ. Press |
| record_format | invenio |
| spelling | cern-9921852021-04-22T02:08:31Zhttp://cds.cern.ch/record/992185engBrowning, Nigel DPennycook, Stephen JCharacterization of High Tc Materials and Devices by Electron MicroscopyOther Fields of PhysicsCambridge Univ. Pressoai:cds.cern.ch:9921852000 |
| spellingShingle | Other Fields of Physics Browning, Nigel D Pennycook, Stephen J Characterization of High Tc Materials and Devices by Electron Microscopy |
| title | Characterization of High Tc Materials and Devices by Electron Microscopy |
| title_full | Characterization of High Tc Materials and Devices by Electron Microscopy |
| title_fullStr | Characterization of High Tc Materials and Devices by Electron Microscopy |
| title_full_unstemmed | Characterization of High Tc Materials and Devices by Electron Microscopy |
| title_short | Characterization of High Tc Materials and Devices by Electron Microscopy |
| title_sort | characterization of high tc materials and devices by electron microscopy |
| topic | Other Fields of Physics |
| url | http://cds.cern.ch/record/992185 |
| work_keys_str_mv | AT browningnigeld characterizationofhightcmaterialsanddevicesbyelectronmicroscopy AT pennycookstephenj characterizationofhightcmaterialsanddevicesbyelectronmicroscopy |