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Digital logic circuits: tests and analysis
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Sams
1982
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/99870 |
| _version_ | 1780876328667447296 |
|---|---|
| author | Middleton, Robert G |
| author_facet | Middleton, Robert G |
| author_sort | Middleton, Robert G |
| collection | CERN |
| id | cern-99870 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1982 |
| publisher | Sams |
| record_format | invenio |
| spelling | cern-998702021-04-22T06:20:18Zhttp://cds.cern.ch/record/99870engMiddleton, Robert GDigital logic circuits: tests and analysisEngineeringSamsoai:cds.cern.ch:998701982 |
| spellingShingle | Engineering Middleton, Robert G Digital logic circuits: tests and analysis |
| title | Digital logic circuits: tests and analysis |
| title_full | Digital logic circuits: tests and analysis |
| title_fullStr | Digital logic circuits: tests and analysis |
| title_full_unstemmed | Digital logic circuits: tests and analysis |
| title_short | Digital logic circuits: tests and analysis |
| title_sort | digital logic circuits: tests and analysis |
| topic | Engineering |
| url | http://cds.cern.ch/record/99870 |
| work_keys_str_mv | AT middletonrobertg digitallogiccircuitstestsandanalysis |