Overview on Measured Properties of VTT's Edgeless Detectors and their use in High Energy Physics

During the past five years VTT has actively developed fabrication processes for the state-of-the-art edgeless strip and pixel detectors with a negligible dead region at the edges. The article summarizes the measured properties of VTT's edgeless detectors and gives references to the relevant journal papers. The measured properties include leakage current, breakdown voltage and capacitance dependences on the detector thickness and polarity. Earlier X-ray tube and radiation source characterization results are revised and new ones are introduced to reveal a pixel response as a function of bias voltage and pixel location in the detector's pixel matrix. Part of the article concentrates on alpha particle characterization of the detectors, especially to the pixel response properties at the edge regions of the detector. The article shows that the edgeless detectors are not losing charge collections efficiency at the edge and the spectroscopic response is comparable to the inner regions of the detector. In addition, the distortion of the electric field at the edge of the detector is almost independent on the applied reverse bias voltage.