Enhanced Field Emission and Emitter Activation on Flat Dry-ice Cleaned Cu Samples

EDark currents caused by enhanced field emission (EFE) are considered as major origin of breakdown events limiting performance of pulsed normal conducting Cu accelerating structures. Measurements on diamond - turned, flat Cu samples (R a = 126 nm) showed first EFE before (after) dry ice cleaning (DI...

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Detalles Bibliográficos
Autores principales: Lagotzky, Stefan, Müller, Guenter, Serbun, Pavel, Calatroni, Sergio, Muranaka, Tomoko
Lenguaje:eng
Publicado: 2014
Materias:
Accelerators and Storage Rings
Acceso en línea:http://cds.cern.ch/record/2003145

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