Detailed Investigation of the Low Energy Secondary Electron Yield of Technical Cu and its Relevance for LHC

The detailed study of the Secondary Electron Yield (SEY) of technical Cu for very low electron landing energies (from 0 to 30 eV) is very important for electron cloud build up in high intensity accelerators and in many other fields of research. However, this question has been rarely addressed due to the intrinsic experimental complexity to control very low energy electrons. Furthermore, several results published in the past have been recently questioned for allegedly suffering from experimental systematics. In this paper, we critically review the experimental method used to study low energy SEY and define more precise energy regions, in which the experimental data can be considered valid. The new SEY curves are then fed into e-cloud simulation codes to address their impact for electron cloud predictions in the LHC.