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Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators

High luminosity particle accelerators can suffer from serious performance drop or limitations due to interaction of the synchrotron radiation produced by the accelerator itself with the accelerator walls. Such interaction may produce a number of photoelectrons, that can either seed electron cloud re...

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Detalles Bibliográficos
Autores principales: Cimino, Roberto, Schäfers, Franz
Lenguaje:eng
Publicado: 2014
Materias:
Acceso en línea:http://cds.cern.ch/record/2003155
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author Cimino, Roberto
Schäfers, Franz
author_facet Cimino, Roberto
Schäfers, Franz
author_sort Cimino, Roberto
collection CERN
description High luminosity particle accelerators can suffer from serious performance drop or limitations due to interaction of the synchrotron radiation produced by the accelerator itself with the accelerator walls. Such interaction may produce a number of photoelectrons, that can either seed electron cloud related instabilities and/or interact anyway with the beam itself, potentially causing its deterioration. To correctly take these effects into account simulation codes depends on the realistic knowledge of Reflectivity and Photoelectron Yield of technical materials. In this work we present a mature technique to study such relevant experimental data for some of the mostly used technical surfaces in accelerators under realistic geometrical con- ditions. Some preliminary results will be presented and discussed.
id oai-inspirehep.net-1314022
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2014
record_format invenio
spelling oai-inspirehep.net-13140222022-08-17T13:30:38Zhttp://cds.cern.ch/record/2003155engCimino, RobertoSchäfers, FranzSoft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity AcceleratorsAccelerators and Storage RingsHigh luminosity particle accelerators can suffer from serious performance drop or limitations due to interaction of the synchrotron radiation produced by the accelerator itself with the accelerator walls. Such interaction may produce a number of photoelectrons, that can either seed electron cloud related instabilities and/or interact anyway with the beam itself, potentially causing its deterioration. To correctly take these effects into account simulation codes depends on the realistic knowledge of Reflectivity and Photoelectron Yield of technical materials. In this work we present a mature technique to study such relevant experimental data for some of the mostly used technical surfaces in accelerators under realistic geometrical con- ditions. Some preliminary results will be presented and discussed.oai:inspirehep.net:13140222014
spellingShingle Accelerators and Storage Rings
Cimino, Roberto
Schäfers, Franz
Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators
title Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators
title_full Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators
title_fullStr Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators
title_full_unstemmed Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators
title_short Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators
title_sort soft x-ray reflectivity and photoelectron yield of technical materials: experimental input for instability simulations in high intensity accelerators
topic Accelerators and Storage Rings
url http://cds.cern.ch/record/2003155
work_keys_str_mv AT ciminoroberto softxrayreflectivityandphotoelectronyieldoftechnicalmaterialsexperimentalinputforinstabilitysimulationsinhighintensityaccelerators
AT schafersfranz softxrayreflectivityandphotoelectronyieldoftechnicalmaterialsexperimentalinputforinstabilitysimulationsinhighintensityaccelerators