ZEMAX Simulations for an Optical System for a Diffraction Radiation Monitor at CesrTA

Diffraction Radiation (DR) is produced when a relativistic charged particle moves in the vicinity of a medium. The target atoms are polarized by the electric field of the charged particle, which then oscillate thus emitting radiation with a very broad spectrum. The spatial-spectral properties of DR are sensitive to various electron beam parameters. Since the energy loss due to DR is so small that the electron beam parameters are unchanged, DR can be used to develop non-invasive diagnostic tools. The aim of this project is to measure the transverse (vertical) beam size using incoherent DR. To achieve the micron-scale resolution required by CLIC, DR in the UV and X-ray spectral-range must be studied. During the next few years, experimental validation of such a scheme will be conducted on the CesrTA at Cornell University, USA. This paper reports on simulations carried out with ZEMAX, studying the optical system used to image the emitted radiation.