Analysis and Modeling of Damage in RRP Nb$_{3}$Sn Wires During Cabling

High-critical current density (J_c) Nb_3Sn wires such as restacked-rod process wires are used in Rutherford cables for high-field superconducting magnets. However, during cabling, the wires experience strong plastic strains, which break some superconducting sub-elements and can degrade the electroma...

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Detalles Bibliográficos
Autores principales: Rochepault, E, Arbelaez, D, Pong, I, Dietderich, D R
Lenguaje:eng
Publicado: 2015
Materias:
Accelerators and Storage Rings
Acceso en línea:https://dx.doi.org/10.1109/TASC.2014.2385471
http://cds.cern.ch/record/2162982
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author Rochepault, E
Arbelaez, D
Pong, I
Dietderich, D R
author_facet Rochepault, E
Arbelaez, D
Pong, I
Dietderich, D R
author_sort Rochepault, E
collection CERN
description High-critical current density (J_c) Nb_3Sn wires such as restacked-rod process wires are used in Rutherford cables for high-field superconducting magnets. However, during cabling, the wires experience strong plastic strains, which break some superconducting sub-elements and can degrade the electromagnetic performances. The damage can be reduced by forming Cu-Sn phases in the sub-elements during an annealing process prior to cabling. We found experimentally that annealing plays a significant role in reducing damage. Furthermore, we used finite-element models to validate the observations on samples and quantify the impact of annealing on damage reduction.
id oai-inspirehep.net-1369256
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2015
record_format invenio
spelling oai-inspirehep.net-13692562019-09-30T06:29:59Zdoi:10.1109/TASC.2014.2385471http://cds.cern.ch/record/2162982engRochepault, EArbelaez, DPong, IDietderich, D RAnalysis and Modeling of Damage in RRP Nb$_{3}$Sn Wires During CablingAccelerators and Storage RingsHigh-critical current density (J_c) Nb_3Sn wires such as restacked-rod process wires are used in Rutherford cables for high-field superconducting magnets. However, during cabling, the wires experience strong plastic strains, which break some superconducting sub-elements and can degrade the electromagnetic performances. The damage can be reduced by forming Cu-Sn phases in the sub-elements during an annealing process prior to cabling. We found experimentally that annealing plays a significant role in reducing damage. Furthermore, we used finite-element models to validate the observations on samples and quantify the impact of annealing on damage reduction.oai:inspirehep.net:13692562015
spellingShingle Accelerators and Storage Rings
Rochepault, E
Arbelaez, D
Pong, I
Dietderich, D R
Analysis and Modeling of Damage in RRP Nb$_{3}$Sn Wires During Cabling
title Analysis and Modeling of Damage in RRP Nb$_{3}$Sn Wires During Cabling
title_full Analysis and Modeling of Damage in RRP Nb$_{3}$Sn Wires During Cabling
title_fullStr Analysis and Modeling of Damage in RRP Nb$_{3}$Sn Wires During Cabling
title_full_unstemmed Analysis and Modeling of Damage in RRP Nb$_{3}$Sn Wires During Cabling
title_short Analysis and Modeling of Damage in RRP Nb$_{3}$Sn Wires During Cabling
title_sort analysis and modeling of damage in rrp nb$_{3}$sn wires during cabling
topic Accelerators and Storage Rings
url https://dx.doi.org/10.1109/TASC.2014.2385471
http://cds.cern.ch/record/2162982
work_keys_str_mv AT rochepaulte analysisandmodelingofdamageinrrpnb3snwiresduringcabling
AT arbelaezd analysisandmodelingofdamageinrrpnb3snwiresduringcabling
AT pongi analysisandmodelingofdamageinrrpnb3snwiresduringcabling
AT dietderichdr analysisandmodelingofdamageinrrpnb3snwiresduringcabling

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