The CMS fast beams condition monitor back-end electronics based on MicroTCA technology: status and development

The Fast Beams Condition Monitor (BCM1F), upgraded for LHC Run II, is used to measure the online luminosity andmachine induced background for the CMS experiment. The detector consists of 24 single-crystal CVD diamond sensorsthat are read out with a custom fast front-end chip fabricated in 130 nm CMOS technology. Since the signals from thesensors are used for real time monitoring of the LHC conditions they are processed by dedicated back-end electronics tomeasure separately rates corresponding to LHC collision products, machine induced background and residual activationexploiting different arrival times. The system is built in MicroTCA technology and uses high speed analog-to-digitalconverters. In operational modes of high rates, consecutive events, spaced in time by less than 12.5 ns, may causepartially overlapping events. Hence, novel signal processing techniques are deployed to resolve overlapping peaks. Thehigh accuracy qualification of the signals is crucial to determine the luminosity and the machine induced backgroundrates for the CMS experiment and the LHC.© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.