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SEL Hardness Assurance in a Mixed Radiation Field

This paper explores the relationship between monoenergetic and mixed-field Single Event Latchup (SEL) cross sections, concluding that for components with a very strong energy dependence and highly-energetic environments, test results from monoenergetic or soft mixed-field spectra can significantly u...

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Autores principales: Alia, Ruben Garcia, Brugger, Markus, Danzeca, Salvatore, Ferlet-Cavrois, Veronique, Frost, Christopher, Gaillard, Remi, Mekki, Julien, Saigné, Frederic, Thornton, Adam, Uznanski, Slawosz, Wrobel, Frederic
Lenguaje:eng
Publicado: 2015
Materias:
Acceso en línea:https://dx.doi.org/10.1109/TNS.2015.2477597
http://cds.cern.ch/record/2148653
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author Alia, Ruben Garcia
Brugger, Markus
Danzeca, Salvatore
Ferlet-Cavrois, Veronique
Frost, Christopher
Gaillard, Remi
Mekki, Julien
Saigné, Frederic
Thornton, Adam
Uznanski, Slawosz
Wrobel, Frederic
author_facet Alia, Ruben Garcia
Brugger, Markus
Danzeca, Salvatore
Ferlet-Cavrois, Veronique
Frost, Christopher
Gaillard, Remi
Mekki, Julien
Saigné, Frederic
Thornton, Adam
Uznanski, Slawosz
Wrobel, Frederic
author_sort Alia, Ruben Garcia
collection CERN
description This paper explores the relationship between monoenergetic and mixed-field Single Event Latchup (SEL) cross sections, concluding that for components with a very strong energy dependence and highly-energetic environments, test results from monoenergetic or soft mixed-field spectra can significantly underestimate the operational failure rate. We introduce a semi-empirical approach that can be used to evaluate the SEL rate for such environments based on monoenergetic measurements and information or assumptions on the respective sensitive volume and materials surrounding it. We show that the presence of high-Z materials such as tungsten is particularly important in determining the hadron cross section energy dependence for components with relatively large LET thresholds.
id oai-inspirehep.net-1411567
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2015
record_format invenio
spelling oai-inspirehep.net-14115672019-09-30T06:29:59Zdoi:10.1109/TNS.2015.2477597http://cds.cern.ch/record/2148653engAlia, Ruben GarciaBrugger, MarkusDanzeca, SalvatoreFerlet-Cavrois, VeroniqueFrost, ChristopherGaillard, RemiMekki, JulienSaigné, FredericThornton, AdamUznanski, SlawoszWrobel, FredericSEL Hardness Assurance in a Mixed Radiation FieldDetectors and Experimental TechniquesThis paper explores the relationship between monoenergetic and mixed-field Single Event Latchup (SEL) cross sections, concluding that for components with a very strong energy dependence and highly-energetic environments, test results from monoenergetic or soft mixed-field spectra can significantly underestimate the operational failure rate. We introduce a semi-empirical approach that can be used to evaluate the SEL rate for such environments based on monoenergetic measurements and information or assumptions on the respective sensitive volume and materials surrounding it. We show that the presence of high-Z materials such as tungsten is particularly important in determining the hadron cross section energy dependence for components with relatively large LET thresholds.oai:inspirehep.net:14115672015
spellingShingle Detectors and Experimental Techniques
Alia, Ruben Garcia
Brugger, Markus
Danzeca, Salvatore
Ferlet-Cavrois, Veronique
Frost, Christopher
Gaillard, Remi
Mekki, Julien
Saigné, Frederic
Thornton, Adam
Uznanski, Slawosz
Wrobel, Frederic
SEL Hardness Assurance in a Mixed Radiation Field
title SEL Hardness Assurance in a Mixed Radiation Field
title_full SEL Hardness Assurance in a Mixed Radiation Field
title_fullStr SEL Hardness Assurance in a Mixed Radiation Field
title_full_unstemmed SEL Hardness Assurance in a Mixed Radiation Field
title_short SEL Hardness Assurance in a Mixed Radiation Field
title_sort sel hardness assurance in a mixed radiation field
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1109/TNS.2015.2477597
http://cds.cern.ch/record/2148653
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