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Development of radiation hard CMOS active pixel sensors for HL-LHC
New pixel detectors, based on commercial high voltage and/or high resistivity full CMOS processes, hold promise as next-generation active pixel sensors for inner and intermediate layers of the upgraded ATLAS tracker. The use of commercial CMOS processes allow cost-effective detector construction and...
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Lenguaje: | eng |
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2016
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Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2015.09.110 http://cds.cern.ch/record/2263097 |
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author | Pernegger, Heinz |
author_facet | Pernegger, Heinz |
author_sort | Pernegger, Heinz |
collection | CERN |
description | New pixel detectors, based on commercial high voltage and/or high resistivity full CMOS processes, hold promise as next-generation active pixel sensors for inner and intermediate layers of the upgraded ATLAS tracker. The use of commercial CMOS processes allow cost-effective detector construction and simpler hybridisation techniques. The paper gives an overview of the results obtained on AMS-produced CMOS sensors coupled to the ATLAS Pixel FE-I4 readout chips. The SOI (silicon-on-insulator) produced sensors by XFAB hold great promise as radiation hard SOI-CMOS sensors due to their combination of partially depleted SOI transistors reducing back-gate effects. The test results include pre-/post-irradiation comparison, measurements of charge collection regions as well as test beam results. |
id | oai-inspirehep.net-1457992 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2016 |
record_format | invenio |
spelling | oai-inspirehep.net-14579922019-09-30T06:29:59Zdoi:10.1016/j.nima.2015.09.110http://cds.cern.ch/record/2263097engPernegger, HeinzDevelopment of radiation hard CMOS active pixel sensors for HL-LHCDetectors and Experimental TechniquesNew pixel detectors, based on commercial high voltage and/or high resistivity full CMOS processes, hold promise as next-generation active pixel sensors for inner and intermediate layers of the upgraded ATLAS tracker. The use of commercial CMOS processes allow cost-effective detector construction and simpler hybridisation techniques. The paper gives an overview of the results obtained on AMS-produced CMOS sensors coupled to the ATLAS Pixel FE-I4 readout chips. The SOI (silicon-on-insulator) produced sensors by XFAB hold great promise as radiation hard SOI-CMOS sensors due to their combination of partially depleted SOI transistors reducing back-gate effects. The test results include pre-/post-irradiation comparison, measurements of charge collection regions as well as test beam results.oai:inspirehep.net:14579922016 |
spellingShingle | Detectors and Experimental Techniques Pernegger, Heinz Development of radiation hard CMOS active pixel sensors for HL-LHC |
title | Development of radiation hard CMOS active pixel sensors for HL-LHC |
title_full | Development of radiation hard CMOS active pixel sensors for HL-LHC |
title_fullStr | Development of radiation hard CMOS active pixel sensors for HL-LHC |
title_full_unstemmed | Development of radiation hard CMOS active pixel sensors for HL-LHC |
title_short | Development of radiation hard CMOS active pixel sensors for HL-LHC |
title_sort | development of radiation hard cmos active pixel sensors for hl-lhc |
topic | Detectors and Experimental Techniques |
url | https://dx.doi.org/10.1016/j.nima.2015.09.110 http://cds.cern.ch/record/2263097 |
work_keys_str_mv | AT perneggerheinz developmentofradiationhardcmosactivepixelsensorsforhllhc |