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Latest results on the HV-CMOS pixel sensor in the ams H18 process

High voltage CMOS (HV-CMOS) pixel sensors are active pixel sensors which have been developed for charged particle detection in high-energy physics experiments. The relatively new HV-CMOS processes on the market enable the implementation of in-pixel logic on the sensor, allowing for semihybrid detect...

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Detalles Bibliográficos
Autor principal: Feigl, Simon
Lenguaje:eng
Publicado: 2015
Materias:
Acceso en línea:https://dx.doi.org/10.1109/ICSENS.2015.7370670
http://cds.cern.ch/record/2159242
Descripción
Sumario:High voltage CMOS (HV-CMOS) pixel sensors are active pixel sensors which have been developed for charged particle detection in high-energy physics experiments. The relatively new HV-CMOS processes on the market enable the implementation of in-pixel logic on the sensor, allowing for semihybrid detector concepts with novel read-out techniques. Early prototype sensors have shown very high radiation hardness, a key property for high-energy physics use. The latest prototype fabricated in the ams H18 process has been measured in a particle test beam for efficiency. Results are presented for a non-irradiated and a neutron-irradiated sensor up to 1 × 1015 (1 MeV neq/cm2). Outlook is given on how to improve the already promising results as well as on further measurements and future development.