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Metrological Characterization of the Bunch Length Measurement by Means of a RF Deflector at the ELI-NP Compton Gamma source
Bunch length measurement in linac can be carried out using a RF deflector, which provides a transverse kick to the beam. The transverse beam size on a screen, placed after the RF deflector, represents the bunch length. In this paper, the metrological characterization of the bunch length measurement...
Autores principales: | , , , , , , , , |
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Lenguaje: | eng |
Publicado: |
2016
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.18429/JACoW-IPAC2016-MOPMB018 http://cds.cern.ch/record/2207306 |
Sumario: | Bunch length measurement in linac can be carried out using a RF deflector, which provides a transverse kick to the beam. The transverse beam size on a screen, placed after the RF deflector, represents the bunch length. In this paper, the metrological characterization of the bunch length measurement technique is proposed. The uncertainty and the systematic errors are estimated by means of a sensitivity analysis to the measurement parameters. The proposed approach has been validated through simulation by means of ELEGANT code on the parameters interesting for the electron linac of the Compton source at the Extreme Light Infrastructure - Nuclear Physics (ELI-NP). |
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