Cargando…
Single Event Effects mitigation with TMRG tool
Single Event Effects (SEE) are a major concern for integrated circuits exposed to radiation. There have been several techniques proposed to protect circuits against radiation-induced upsets. Among the others, the Triple Modular Redundancy (TMR) technique is one of the most popular. The purpose of th...
Autor principal: | Kulis, S |
---|---|
Lenguaje: | eng |
Publicado: |
2017
|
Materias: | |
Acceso en línea: | https://dx.doi.org/10.1088/1748-0221/12/01/C01082 http://cds.cern.ch/record/2275130 |
Ejemplares similares
-
Single-Event Effect Responses of Integrated Planar Inductors in 65-nm CMOS
por: Biereigel, Stefan, et al.
Publicado: (2021) -
Event visualisation tools at LEP
por: McNally, D
Publicado: (1997) -
Timepix3: first measurements and characterization of a hybrid-pixel detector working in event driven mode
por: Frojdh, E, et al.
Publicado: (2015) -
Single event effects actel AX FPGA
por: Machefert, F P
Publicado: (2002) -
Direct Study of Neutron Induced Single-Event Effects
por: Dolezal, Z, et al.
Publicado: (2001)