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Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1

CMOS active pixel sensors are being investigated for their potential use in the ATLAS inner tracker upgrade at the HL-LHC. The new inner tracker will have to handle a significant increase in luminosity while maintaining a sufficient signal-to-noise ratio and pulse shaping times. This paper focuses o...

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Detalles Bibliográficos
Autores principales: Kanisauskas, K, Affolder, A, Arndt, K, Bates, R, Benoit, M, Bello, F Di, Blue, A, Bortoletto, D, Buckland, M, Buttar, C, Caragiulo, P, Das, D, Dopke, J, Dragone, A, Ehrler, F, Fadeyev, V, Galloway, Z, Grabas, H, Gregor, I M, Grenier, P, Grillo, A, Hiti, B, Hoeferkamp, M, Hommels, L B A, Huffman, B T, John, J, Kenney, C, Kramberger, J, Liang, Z, Mandic, I, Maneuski, D, Martinez-Mckinney, F, MacMahon, S, Meng, L, Mikuž, M, Muenstermann, D, Nickerson, R, Peric, I, Phillips, P, Plackett, R, Rubbo, F, Segal, J, Seidel, S, Seiden, A, Shipsey, I, Song, W, Staniztki, M, Su, D, Tamma, C, Turchetta, R, Vigani, L, Volk, J, Wang, R, Warren, M, Wilson, F, Worm, S, Xiu, Q, Zhang, J, Zhu, H
Lenguaje:eng
Publicado: 2017
Materias:
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/12/02/P02010
http://cds.cern.ch/record/2275299
_version_ 1780955150934867968
author Kanisauskas, K
Affolder, A
Arndt, K
Bates, R
Benoit, M
Bello, F Di
Blue, A
Bortoletto, D
Buckland, M
Buttar, C
Caragiulo, P
Das, D
Dopke, J
Dragone, A
Ehrler, F
Fadeyev, V
Galloway, Z
Grabas, H
Gregor, I M
Grenier, P
Grillo, A
Hiti, B
Hoeferkamp, M
Hommels, L B A
Huffman, B T
John, J
Kenney, C
Kramberger, J
Liang, Z
Mandic, I
Maneuski, D
Martinez-Mckinney, F
MacMahon, S
Meng, L
Mikuž, M
Muenstermann, D
Nickerson, R
Peric, I
Phillips, P
Plackett, R
Rubbo, F
Segal, J
Seidel, S
Seiden, A
Shipsey, I
Song, W
Staniztki, M
Su, D
Tamma, C
Turchetta, R
Vigani, L
Volk, J
Wang, R
Warren, M
Wilson, F
Worm, S
Xiu, Q
Zhang, J
Zhu, H
author_facet Kanisauskas, K
Affolder, A
Arndt, K
Bates, R
Benoit, M
Bello, F Di
Blue, A
Bortoletto, D
Buckland, M
Buttar, C
Caragiulo, P
Das, D
Dopke, J
Dragone, A
Ehrler, F
Fadeyev, V
Galloway, Z
Grabas, H
Gregor, I M
Grenier, P
Grillo, A
Hiti, B
Hoeferkamp, M
Hommels, L B A
Huffman, B T
John, J
Kenney, C
Kramberger, J
Liang, Z
Mandic, I
Maneuski, D
Martinez-Mckinney, F
MacMahon, S
Meng, L
Mikuž, M
Muenstermann, D
Nickerson, R
Peric, I
Phillips, P
Plackett, R
Rubbo, F
Segal, J
Seidel, S
Seiden, A
Shipsey, I
Song, W
Staniztki, M
Su, D
Tamma, C
Turchetta, R
Vigani, L
Volk, J
Wang, R
Warren, M
Wilson, F
Worm, S
Xiu, Q
Zhang, J
Zhu, H
author_sort Kanisauskas, K
collection CERN
description CMOS active pixel sensors are being investigated for their potential use in the ATLAS inner tracker upgrade at the HL-LHC. The new inner tracker will have to handle a significant increase in luminosity while maintaining a sufficient signal-to-noise ratio and pulse shaping times. This paper focuses on the prototype chip 'HVStripV1' (manufactured in the AMS HV-CMOS 350nm process) characterization before and after irradiation up to fluence levels expected for the strip region in the HL-LHC environment. The results indicate an increase of depletion region after irradiation for the same bias voltage by a factor of ≈2.4 and ≈2.8 for two active pixels on the test chip. There was also a notable increase in noise levels from $85 e^−$ to $386 e^−$ and from $75 e^−$ to $277 e^−$ for the corresponding pixels.
id oai-inspirehep.net-1514110
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
record_format invenio
spelling oai-inspirehep.net-15141102019-10-15T15:19:46Zdoi:10.1088/1748-0221/12/02/P02010http://cds.cern.ch/record/2275299engKanisauskas, KAffolder, AArndt, KBates, RBenoit, MBello, F DiBlue, ABortoletto, DBuckland, MButtar, CCaragiulo, PDas, DDopke, JDragone, AEhrler, FFadeyev, VGalloway, ZGrabas, HGregor, I MGrenier, PGrillo, AHiti, BHoeferkamp, MHommels, L B AHuffman, B TJohn, JKenney, CKramberger, JLiang, ZMandic, IManeuski, DMartinez-Mckinney, FMacMahon, SMeng, LMikuž, MMuenstermann, DNickerson, RPeric, IPhillips, PPlackett, RRubbo, FSegal, JSeidel, SSeiden, AShipsey, ISong, WStaniztki, MSu, DTamma, CTurchetta, RVigani, LVolk, JWang, RWarren, MWilson, FWorm, SXiu, QZhang, JZhu, HRadiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1Detectors and Experimental TechniquesCMOS active pixel sensors are being investigated for their potential use in the ATLAS inner tracker upgrade at the HL-LHC. The new inner tracker will have to handle a significant increase in luminosity while maintaining a sufficient signal-to-noise ratio and pulse shaping times. This paper focuses on the prototype chip 'HVStripV1' (manufactured in the AMS HV-CMOS 350nm process) characterization before and after irradiation up to fluence levels expected for the strip region in the HL-LHC environment. The results indicate an increase of depletion region after irradiation for the same bias voltage by a factor of ≈2.4 and ≈2.8 for two active pixels on the test chip. There was also a notable increase in noise levels from $85 e^−$ to $386 e^−$ and from $75 e^−$ to $277 e^−$ for the corresponding pixels.oai:inspirehep.net:15141102017
spellingShingle Detectors and Experimental Techniques
Kanisauskas, K
Affolder, A
Arndt, K
Bates, R
Benoit, M
Bello, F Di
Blue, A
Bortoletto, D
Buckland, M
Buttar, C
Caragiulo, P
Das, D
Dopke, J
Dragone, A
Ehrler, F
Fadeyev, V
Galloway, Z
Grabas, H
Gregor, I M
Grenier, P
Grillo, A
Hiti, B
Hoeferkamp, M
Hommels, L B A
Huffman, B T
John, J
Kenney, C
Kramberger, J
Liang, Z
Mandic, I
Maneuski, D
Martinez-Mckinney, F
MacMahon, S
Meng, L
Mikuž, M
Muenstermann, D
Nickerson, R
Peric, I
Phillips, P
Plackett, R
Rubbo, F
Segal, J
Seidel, S
Seiden, A
Shipsey, I
Song, W
Staniztki, M
Su, D
Tamma, C
Turchetta, R
Vigani, L
Volk, J
Wang, R
Warren, M
Wilson, F
Worm, S
Xiu, Q
Zhang, J
Zhu, H
Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1
title Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1
title_full Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1
title_fullStr Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1
title_full_unstemmed Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1
title_short Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1
title_sort radiation hardness studies of ams hv-cmos 350 nm prototype chip hvstripv1
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1088/1748-0221/12/02/P02010
http://cds.cern.ch/record/2275299
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