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Monte Carlo Evaluation of Single Event Effects in a Deep-Submicron Bulk Technology: Comparison Between Atmospheric and Accelerator Environment
In this work, the expected SEE rate in a generic model of a state-of-the-art SRAM memory was studied as a function of the critical charge in different radiation environments. The FLUKA Monte Carlo code was used to evaluate the SEE mono-energetic cross section for different particles as well as the S...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
2017
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/TNS.2016.2621238 http://cds.cern.ch/record/2266895 |