N-doped niobium accelerating cavities: Analyzing model applicability

The goal of this research was to analyse data from multiple cavities in order to test the viability of a model for surface resistance proposed previously. The model intends to describe the behaviour of the quality factor with respect to the RF field strength, while exploring the physical cause of this phenomenon; the model is pretty general, but will be checked here specifically for N-doped niobium cavities. The data were obtained from two single-cell 1.3 GHz cavities manufactured and tested at Jefferson Lab in Newport News, VA, USA.