Cargando…
Surface damage characterization of FBK devices for High Luminosity LHC (HL-LHC) operations
The very high fluences (e.g. up to $2 \times 10^{16} 1$ MeV $n_{eq}/cm^{2}$) and total ionising doses (TID) of the order of 1 Grad, expected at the High Luminosity LHC (HL-LHC), impose new challenges for the design of effective, radiation resistant detectors. Ionising energy loss is the dominant eff...
| Autores principales: | , , , , , , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
2017
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1088/1748-0221/12/12/P12010 http://cds.cern.ch/record/2306353 |