Semi-analytic off-axis X-ray source model

Spectral computed tomography (CT) systems are employed with energy-resolving photon counting detectors. Incorporation of a spectrally accurate x-ray beam model in image reconstruction helps to improve material identification and quantification by these systems. Using an inaccurate x-ray model in spe...

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Detalles Bibliográficos
Autores principales: Shamshad, M, Anjomrouz, M, Smithies, D J, Largeau, A, Lu, G, Atharifard, A, Vanden Broeke, L, Aamir, R, Panta, R K, Walsh, M F, Goulter, B P, Healy, J L, Bheesette, S, Bell, S T, Bateman, C J, Butler, A P H, Butler, P H
Lenguaje:eng
Publicado: 2017
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/12/10/P10013
http://cds.cern.ch/record/2301990

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