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Development of visual inspection system for detecting surface defects on sensor chip

This paper presents a visual inspection method based on image processing techniques. The method aims to detect surface defects found on pixel chip pads. Pixel chip is a tiny sensor used in Inner Tracking System (ITS) — a large particle detector of ALICE experiment (A Large Ion Collider Experiment)....

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Detalles Bibliográficos
Autores principales:	Nurhadiyatna, A, Loncaric, S, Prakasa, E, Kurniawan, E, Khoirudin, A A, Musa, L, Reidler, P
Lenguaje:	eng
Publicado:	2018
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.1109/IC3INA.2017.8251748 http://cds.cern.ch/record/2312283

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