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Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics

Vulnerability of a variety of components for particle accelerators electronics to single event effects, total ionizing dose and displacement damage has been analyzed. The tested parts include analog, linear, digital, and hybrid devices.

Detalles Bibliográficos
Autores principales:	Danzeca, S, Peronnard, P, Foucard, G, Tsiligiannis, G, Secondo, R, Ferraro, R, McAllister, C G, Borel, T, Brugger, M, Masi, A, Gilardoni, S
Lenguaje:	eng
Publicado:	2017
Materias:	Accelerators and Storage Rings
Acceso en línea:	https://dx.doi.org/10.1109/NSREC.2017.8115434 http://cds.cern.ch/record/2303668

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