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High-Energy Electron-Induced SEUs and Jovian Environment Impact

We present experimental evidence of electron-induced upsets in a reference European Space Agency (ESA) single event upset (SEU) monitor, induced by a 200-MeV electron beam at the Very energetic Electronic facility for Space Planetary Exploration in harsh Radiation environments facility at CERN. Comp...

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Detalles Bibliográficos
Autores principales: Tali, Maris, Alía, Rubén García, Brugger, Markus, Ferlet-Cavrois, Veronique, Corsini, Roberto, Farabolini, Wilfrid, Mohammadzadeh, Ali, Santin, Giovanni, Virtanen, Ari
Lenguaje:eng
Publicado: 2017
Materias:
Acceso en línea:https://dx.doi.org/10.1109/TNS.2017.2713445
http://cds.cern.ch/record/2302812

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