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High-Energy Electron-Induced SEUs and Jovian Environment Impact
We present experimental evidence of electron-induced upsets in a reference European Space Agency (ESA) single event upset (SEU) monitor, induced by a 200-MeV electron beam at the Very energetic Electronic facility for Space Planetary Exploration in harsh Radiation environments facility at CERN. Comp...
Autores principales: | Tali, Maris, Alía, Rubén García, Brugger, Markus, Ferlet-Cavrois, Veronique, Corsini, Roberto, Farabolini, Wilfrid, Mohammadzadeh, Ali, Santin, Giovanni, Virtanen, Ari |
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Lenguaje: | eng |
Publicado: |
2017
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1109/TNS.2017.2713445 http://cds.cern.ch/record/2302812 |
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