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Measurement of spatial resolution and charge collection in double sided double metal silicon microstrip detectors

Detalles Bibliográficos
Autor principal: Troncon, C
Lenguaje:eng
Publicado: 1995
Materias:
Acceso en línea:http://cds.cern.ch/record/2627688
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author Troncon, C
author_facet Troncon, C
author_sort Troncon, C
collection CERN
id oai-inspirehep.net-1660574
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1995
record_format invenio
spelling oai-inspirehep.net-16605742021-03-18T21:02:16Zhttp://cds.cern.ch/record/2627688engTroncon, CMeasurement of spatial resolution and charge collection in double sided double metal silicon microstrip detectorsParticle Physics - ExperimentDELPHI-95-158-TRACK-84-MVX-7oai:inspirehep.net:16605741995
spellingShingle Particle Physics - Experiment
Troncon, C
Measurement of spatial resolution and charge collection in double sided double metal silicon microstrip detectors
title Measurement of spatial resolution and charge collection in double sided double metal silicon microstrip detectors
title_full Measurement of spatial resolution and charge collection in double sided double metal silicon microstrip detectors
title_fullStr Measurement of spatial resolution and charge collection in double sided double metal silicon microstrip detectors
title_full_unstemmed Measurement of spatial resolution and charge collection in double sided double metal silicon microstrip detectors
title_short Measurement of spatial resolution and charge collection in double sided double metal silicon microstrip detectors
title_sort measurement of spatial resolution and charge collection in double sided double metal silicon microstrip detectors
topic Particle Physics - Experiment
url http://cds.cern.ch/record/2627688
work_keys_str_mv AT tronconc measurementofspatialresolutionandchargecollectionindoublesideddoublemetalsiliconmicrostripdetectors