Thermal stressing mitigation possibility intended for a DC-current magnet supply based on high power IGBT modules

This work investigates the possibility to reduce the thermal stressing of high power IGBT modules in a DC-current application. Using four load current profiles as examples, two mitigation strategies are presented and their benefit to the power stack in terms of lifetime prolongation is evaluated. In...

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Detalles Bibliográficos
Autores principales: Asimakopoulos, P, Papastergiou, K D, Thiringer, T, Bongiorno, M
Lenguaje:eng
Publicado: 2017
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.23919/EPE17ECCEEurope.2017.8099201
http://cds.cern.ch/record/2314468
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author Asimakopoulos, P
Papastergiou, K D
Thiringer, T
Bongiorno, M
author_facet Asimakopoulos, P
Papastergiou, K D
Thiringer, T
Bongiorno, M
author_sort Asimakopoulos, P
collection CERN
description This work investigates the possibility to reduce the thermal stressing of high power IGBT modules in a DC-current application. Using four load current profiles as examples, two mitigation strategies are presented and their benefit to the power stack in terms of lifetime prolongation is evaluated. In the final part of the work, the investigation focuses on the relation between the shape of the load current and the potential for thermal stressing limitation that the proposed mitigation strategies can provide.
id oai-inspirehep.net-1665675
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
record_format invenio
spelling oai-inspirehep.net-16656752019-09-30T06:29:59Zdoi:10.23919/EPE17ECCEEurope.2017.8099201http://cds.cern.ch/record/2314468engAsimakopoulos, PPapastergiou, K DThiringer, TBongiorno, MThermal stressing mitigation possibility intended for a DC-current magnet supply based on high power IGBT modulesDetectors and Experimental TechniquesThis work investigates the possibility to reduce the thermal stressing of high power IGBT modules in a DC-current application. Using four load current profiles as examples, two mitigation strategies are presented and their benefit to the power stack in terms of lifetime prolongation is evaluated. In the final part of the work, the investigation focuses on the relation between the shape of the load current and the potential for thermal stressing limitation that the proposed mitigation strategies can provide.oai:inspirehep.net:16656752017
spellingShingle Detectors and Experimental Techniques
Asimakopoulos, P
Papastergiou, K D
Thiringer, T
Bongiorno, M
Thermal stressing mitigation possibility intended for a DC-current magnet supply based on high power IGBT modules
title Thermal stressing mitigation possibility intended for a DC-current magnet supply based on high power IGBT modules
title_full Thermal stressing mitigation possibility intended for a DC-current magnet supply based on high power IGBT modules
title_fullStr Thermal stressing mitigation possibility intended for a DC-current magnet supply based on high power IGBT modules
title_full_unstemmed Thermal stressing mitigation possibility intended for a DC-current magnet supply based on high power IGBT modules
title_short Thermal stressing mitigation possibility intended for a DC-current magnet supply based on high power IGBT modules
title_sort thermal stressing mitigation possibility intended for a dc-current magnet supply based on high power igbt modules
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.23919/EPE17ECCEEurope.2017.8099201
http://cds.cern.ch/record/2314468
work_keys_str_mv AT asimakopoulosp thermalstressingmitigationpossibilityintendedforadccurrentmagnetsupplybasedonhighpowerigbtmodules
AT papastergioukd thermalstressingmitigationpossibilityintendedforadccurrentmagnetsupplybasedonhighpowerigbtmodules
AT thiringert thermalstressingmitigationpossibilityintendedforadccurrentmagnetsupplybasedonhighpowerigbtmodules
AT bongiornom thermalstressingmitigationpossibilityintendedforadccurrentmagnetsupplybasedonhighpowerigbtmodules

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