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Analyzing the impact of radiation-induced failures in flash-based APSoC with and without fault tolerance techniques at CERN environment
All Programmable System-on-Chip (APSoC) devices are designed to provide higher overall programmable flexibility and system performance at lower costs. Such characteristics make APSoCs very suitable and attractive for critical environments, such as the one encountered in the accelerators chain of the...
| Autores principales: | , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2017
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/j.microrel.2017.06.049 http://cds.cern.ch/record/2320001 |