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Charge collection in irradiated silicon detectors

Detalles Bibliográficos
Autor principal: Krasel, Olaf
Lenguaje:eng
Publicado: 2018
Materias:
Acceso en línea:https://dx.doi.org/10.17877/DE290R-14839
http://cds.cern.ch/record/2630423
_version_ 1780959466622025728
author Krasel, Olaf
author_facet Krasel, Olaf
author_sort Krasel, Olaf
collection CERN
id oai-inspirehep.net-1681351
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2018
record_format invenio
spelling oai-inspirehep.net-16813512019-09-30T06:29:59Zdoi:10.17877/DE290R-14839http://cds.cern.ch/record/2630423engKrasel, OlafCharge collection in irradiated silicon detectorsDetectors and Experimental TechniquesCERN-THESIS-2004-108oai:inspirehep.net:16813512018-07-12T05:04:51Z
spellingShingle Detectors and Experimental Techniques
Krasel, Olaf
Charge collection in irradiated silicon detectors
title Charge collection in irradiated silicon detectors
title_full Charge collection in irradiated silicon detectors
title_fullStr Charge collection in irradiated silicon detectors
title_full_unstemmed Charge collection in irradiated silicon detectors
title_short Charge collection in irradiated silicon detectors
title_sort charge collection in irradiated silicon detectors
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.17877/DE290R-14839
http://cds.cern.ch/record/2630423
work_keys_str_mv AT kraselolaf chargecollectioninirradiatedsilicondetectors