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Reconstructing Space-Charge Distorted IPM Profiles with Machine Learning Algorithms
Measurements of undistorted transverse profiles via Ionization Profile Monitors (IPMs) may pose a great challenge for high brightness or high energy beams due to interaction of ionized electrons or ions with the electromagnetic field of the beam. This contribution presents application of various mac...
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
2018
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.18429/JACoW-IPAC2018-WEPAK008 https://dx.doi.org/10.1088/1742-6596/1067/7/072003 http://cds.cern.ch/record/2668169 |