Selection of Wires for the New Generation of Fast Wire Scanners at CERN

A new generation of fast wire scanners is being produced as part of the LHC Injector Upgrade (LIU) project at CERN. The LIU beam parameters imply that these wire scanners will need to operate with significantly brighter beams. This requires wires scanner systems with micron level accuracy and wires...

Descripción completa

Detalles Bibliográficos
Autores principales: Mariet, Alexandre, Veness, Raymond
Lenguaje:eng
Publicado: JACoW 2019
Materias:
Accelerators and Storage Rings
Acceso en línea:https://dx.doi.org/10.18429/JACoW-IBIC2018-WEPC19
http://cds.cern.ch/record/2716031
_version_ 1780965497071730688
author Mariet, Alexandre
Veness, Raymond
author_facet Mariet, Alexandre
Veness, Raymond
author_sort Mariet, Alexandre
collection CERN
description A new generation of fast wire scanners is being produced as part of the LHC Injector Upgrade (LIU) project at CERN. The LIU beam parameters imply that these wire scanners will need to operate with significantly brighter beams. This requires wires scanner systems with micron level accuracy and wires with a considerably increased tolerance to beam damage. This paper presents the method of selection of such wires in terms of material choice and geometry. It also reports on studies with novel materials with a potential to further extend the reach of wire scanners for high brightness beams.
id oai-inspirehep.net-1736112
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2019
publisher JACoW
record_format invenio
spelling oai-inspirehep.net-17361122020-12-14T13:46:14Zdoi:10.18429/JACoW-IBIC2018-WEPC19http://cds.cern.ch/record/2716031engMariet, AlexandreVeness, RaymondSelection of Wires for the New Generation of Fast Wire Scanners at CERNAccelerators and Storage RingsA new generation of fast wire scanners is being produced as part of the LHC Injector Upgrade (LIU) project at CERN. The LIU beam parameters imply that these wire scanners will need to operate with significantly brighter beams. This requires wires scanner systems with micron level accuracy and wires with a considerably increased tolerance to beam damage. This paper presents the method of selection of such wires in terms of material choice and geometry. It also reports on studies with novel materials with a potential to further extend the reach of wire scanners for high brightness beams.JACoWoai:inspirehep.net:17361122019
spellingShingle Accelerators and Storage Rings
Mariet, Alexandre
Veness, Raymond
Selection of Wires for the New Generation of Fast Wire Scanners at CERN
title Selection of Wires for the New Generation of Fast Wire Scanners at CERN
title_full Selection of Wires for the New Generation of Fast Wire Scanners at CERN
title_fullStr Selection of Wires for the New Generation of Fast Wire Scanners at CERN
title_full_unstemmed Selection of Wires for the New Generation of Fast Wire Scanners at CERN
title_short Selection of Wires for the New Generation of Fast Wire Scanners at CERN
title_sort selection of wires for the new generation of fast wire scanners at cern
topic Accelerators and Storage Rings
url https://dx.doi.org/10.18429/JACoW-IBIC2018-WEPC19
http://cds.cern.ch/record/2716031
work_keys_str_mv AT marietalexandre selectionofwiresforthenewgenerationoffastwirescannersatcern
AT venessraymond selectionofwiresforthenewgenerationoffastwirescannersatcern

Ejemplares similares