In situ radiation damage studies of optoelectronics in the ATLAS SemiConductor Tracker

This paper presents results on in situ measurements of radiation damage for the on-detector optoelectronics for the ATLAS SemiConductor Tracker. The results come from proton-proton collisions in LHC during operation in 2016, 2017 and 2018. The results for both p-i-n diodes and VCSELs are given and c...

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Detalles Bibliográficos
Autores principales: Dawson, I, Gallop, B, Liu, J, Miyagawa, P S, Phillips, P W, Pownall, G D, Robinson, D, Weidberg, A R
Lenguaje:eng
Publicado: 2019
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/14/07/P07014
http://cds.cern.ch/record/2688995
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author Dawson, I
Gallop, B
Liu, J
Miyagawa, P S
Phillips, P W
Pownall, G D
Robinson, D
Weidberg, A R
author_facet Dawson, I
Gallop, B
Liu, J
Miyagawa, P S
Phillips, P W
Pownall, G D
Robinson, D
Weidberg, A R
author_sort Dawson, I
collection CERN
description This paper presents results on in situ measurements of radiation damage for the on-detector optoelectronics for the ATLAS SemiConductor Tracker. The results come from proton-proton collisions in LHC during operation in 2016, 2017 and 2018. The results for both p-i-n diodes and VCSELs are given and compared to expectations from beam tests of devices from the same wafer, before the start of LHC operation. The VCSELs show evidence for some radiation damage as expected from earlier studies. The magnitude of the damage is compared with simple extrapolations from test beam data. The p-i-n diodes do show significant radiation damage as expected from test beam studies.
id oai-inspirehep.net-1744749
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2019
record_format invenio
spelling oai-inspirehep.net-17447492019-09-30T06:29:59Zdoi:10.1088/1748-0221/14/07/P07014http://cds.cern.ch/record/2688995engDawson, IGallop, BLiu, JMiyagawa, P SPhillips, P WPownall, G DRobinson, DWeidberg, A RIn situ radiation damage studies of optoelectronics in the ATLAS SemiConductor TrackerDetectors and Experimental TechniquesThis paper presents results on in situ measurements of radiation damage for the on-detector optoelectronics for the ATLAS SemiConductor Tracker. The results come from proton-proton collisions in LHC during operation in 2016, 2017 and 2018. The results for both p-i-n diodes and VCSELs are given and compared to expectations from beam tests of devices from the same wafer, before the start of LHC operation. The VCSELs show evidence for some radiation damage as expected from earlier studies. The magnitude of the damage is compared with simple extrapolations from test beam data. The p-i-n diodes do show significant radiation damage as expected from test beam studies.oai:inspirehep.net:17447492019
spellingShingle Detectors and Experimental Techniques
Dawson, I
Gallop, B
Liu, J
Miyagawa, P S
Phillips, P W
Pownall, G D
Robinson, D
Weidberg, A R
In situ radiation damage studies of optoelectronics in the ATLAS SemiConductor Tracker
title In situ radiation damage studies of optoelectronics in the ATLAS SemiConductor Tracker
title_full In situ radiation damage studies of optoelectronics in the ATLAS SemiConductor Tracker
title_fullStr In situ radiation damage studies of optoelectronics in the ATLAS SemiConductor Tracker
title_full_unstemmed In situ radiation damage studies of optoelectronics in the ATLAS SemiConductor Tracker
title_short In situ radiation damage studies of optoelectronics in the ATLAS SemiConductor Tracker
title_sort in situ radiation damage studies of optoelectronics in the atlas semiconductor tracker
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1088/1748-0221/14/07/P07014
http://cds.cern.ch/record/2688995
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AT gallopb insituradiationdamagestudiesofoptoelectronicsintheatlassemiconductortracker
AT liuj insituradiationdamagestudiesofoptoelectronicsintheatlassemiconductortracker
AT miyagawaps insituradiationdamagestudiesofoptoelectronicsintheatlassemiconductortracker
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AT weidbergar insituradiationdamagestudiesofoptoelectronicsintheatlassemiconductortracker

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