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Characterisation of the radiation hardness of cryogenic bypass diodes for the HL-LHC inner triplet quadrupole circuit
The powering layout of the new HL-LHC Nb$_3$Sn triplet circuits is the use of cryogenic bypass diodes, where the diodes are located inside an extension to the magnet cryostat, operated in superfluid helium and exposed to radiation. Therefore, the radiation hardness of different type of bypass diodes...
Autores principales: | , , , , , , , , , , , , , , , , , , , , , , , , |
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Lenguaje: | eng |
Publicado: |
2019
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.18429/JACoW-IPAC2019-THPTS067 http://cds.cern.ch/record/2690323 |
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author | Wollmann, Daniel Bernhard, Axel Cangialosi, Chiara Cerutti, Francesco D'Angelo, Giorgio Danzeca, Salvatore Denz, Reiner Favre, Mathieu Garcia Alia, Ruben Hagedorn, Dietrich Infantino, Angelo Kirby, Glyn Vammen Kistrup, Lucas Koettig, Torsten Lendaro, Jerome Lindstrom, Bjorn Monteuuis, Arnaud Müller, Anke-Susanne Rodriguez-Mateos, Felix Siemko, Andrzej Stachon, Krzysztof Tsinganis, Andrea Valette, Matthieu Verweij, Arjan Will, Andreas |
author_facet | Wollmann, Daniel Bernhard, Axel Cangialosi, Chiara Cerutti, Francesco D'Angelo, Giorgio Danzeca, Salvatore Denz, Reiner Favre, Mathieu Garcia Alia, Ruben Hagedorn, Dietrich Infantino, Angelo Kirby, Glyn Vammen Kistrup, Lucas Koettig, Torsten Lendaro, Jerome Lindstrom, Bjorn Monteuuis, Arnaud Müller, Anke-Susanne Rodriguez-Mateos, Felix Siemko, Andrzej Stachon, Krzysztof Tsinganis, Andrea Valette, Matthieu Verweij, Arjan Will, Andreas |
author_sort | Wollmann, Daniel |
collection | CERN |
description | The powering layout of the new HL-LHC Nb$_3$Sn triplet circuits is the use of cryogenic bypass diodes, where the diodes are located inside an extension to the magnet cryostat, operated in superfluid helium and exposed to radiation. Therefore, the radiation hardness of different type of bypass diodes has been tested at low temperatures in CERN’s CHARM irradiation facility during the operational year 2018. The forward characteristics, the turn on voltage and the reverse blocking voltage of each diode were measured weekly at 4.2 K and 77 K, respectively, as a function of the accumulated radiation dose. The diodes were submitted to a dose close to 12 kGy and a 1 MeV equivalent neutron fluence of $2.2 \times 10^{14}$ n/cm$^2$. After the end of the irradiation campaign the annealing behaviour of the diodes was tested by increasing the temperature slowly to 300 K. This paper describes the experimental setup, the measurement procedure and discusses the results of the measurements. |
id | oai-inspirehep.net-1745827 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2019 |
record_format | invenio |
spelling | oai-inspirehep.net-17458272022-04-08T08:16:34Zdoi:10.18429/JACoW-IPAC2019-THPTS067http://cds.cern.ch/record/2690323engWollmann, DanielBernhard, AxelCangialosi, ChiaraCerutti, FrancescoD'Angelo, GiorgioDanzeca, SalvatoreDenz, ReinerFavre, MathieuGarcia Alia, RubenHagedorn, DietrichInfantino, AngeloKirby, GlynVammen Kistrup, LucasKoettig, TorstenLendaro, JeromeLindstrom, BjornMonteuuis, ArnaudMüller, Anke-SusanneRodriguez-Mateos, FelixSiemko, AndrzejStachon, KrzysztofTsinganis, AndreaValette, MatthieuVerweij, ArjanWill, AndreasCharacterisation of the radiation hardness of cryogenic bypass diodes for the HL-LHC inner triplet quadrupole circuitAccelerators and Storage RingsThe powering layout of the new HL-LHC Nb$_3$Sn triplet circuits is the use of cryogenic bypass diodes, where the diodes are located inside an extension to the magnet cryostat, operated in superfluid helium and exposed to radiation. Therefore, the radiation hardness of different type of bypass diodes has been tested at low temperatures in CERN’s CHARM irradiation facility during the operational year 2018. The forward characteristics, the turn on voltage and the reverse blocking voltage of each diode were measured weekly at 4.2 K and 77 K, respectively, as a function of the accumulated radiation dose. The diodes were submitted to a dose close to 12 kGy and a 1 MeV equivalent neutron fluence of $2.2 \times 10^{14}$ n/cm$^2$. After the end of the irradiation campaign the annealing behaviour of the diodes was tested by increasing the temperature slowly to 300 K. This paper describes the experimental setup, the measurement procedure and discusses the results of the measurements.CERN-ACC-2019-265oai:inspirehep.net:17458272019 |
spellingShingle | Accelerators and Storage Rings Wollmann, Daniel Bernhard, Axel Cangialosi, Chiara Cerutti, Francesco D'Angelo, Giorgio Danzeca, Salvatore Denz, Reiner Favre, Mathieu Garcia Alia, Ruben Hagedorn, Dietrich Infantino, Angelo Kirby, Glyn Vammen Kistrup, Lucas Koettig, Torsten Lendaro, Jerome Lindstrom, Bjorn Monteuuis, Arnaud Müller, Anke-Susanne Rodriguez-Mateos, Felix Siemko, Andrzej Stachon, Krzysztof Tsinganis, Andrea Valette, Matthieu Verweij, Arjan Will, Andreas Characterisation of the radiation hardness of cryogenic bypass diodes for the HL-LHC inner triplet quadrupole circuit |
title | Characterisation of the radiation hardness of cryogenic bypass diodes for the HL-LHC inner triplet quadrupole circuit |
title_full | Characterisation of the radiation hardness of cryogenic bypass diodes for the HL-LHC inner triplet quadrupole circuit |
title_fullStr | Characterisation of the radiation hardness of cryogenic bypass diodes for the HL-LHC inner triplet quadrupole circuit |
title_full_unstemmed | Characterisation of the radiation hardness of cryogenic bypass diodes for the HL-LHC inner triplet quadrupole circuit |
title_short | Characterisation of the radiation hardness of cryogenic bypass diodes for the HL-LHC inner triplet quadrupole circuit |
title_sort | characterisation of the radiation hardness of cryogenic bypass diodes for the hl-lhc inner triplet quadrupole circuit |
topic | Accelerators and Storage Rings |
url | https://dx.doi.org/10.18429/JACoW-IPAC2019-THPTS067 http://cds.cern.ch/record/2690323 |
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