Cargando…
Radiation damage modeling: TCAD simulation
The exceptional performance of the silicon sensors in the radiation environment has led to their extensive application in high energy physics. Even so, the future experiments foresee these sensors to be exposed to higher radiation levels. Radiation induces a change in the macroscopic properties of t...
Autor principal: | Jain, Geetika |
---|---|
Lenguaje: | eng |
Publicado: |
SISSA
2019
|
Materias: | |
Acceso en línea: | https://dx.doi.org/10.22323/1.348.0017 http://cds.cern.ch/record/2697098 |
Ejemplares similares
-
TCAD radiation damage model
por: Passeri, D, et al.
Publicado: (2020) -
Development of a silicon bulk radiation damage model for Sentaurus TCAD
por: Folkestad, Å, et al.
Publicado: (2017) -
Measurements and TCAD Simulations of Bulk and Surface Radiation Damage Effects
por: F. Moscatelli, et al.
Publicado: (2016) -
TCAD advanced radiation damage modelling in silicon detectors
por: Morozzi, A., et al.
Publicado: (2020) -
\title{Development of Radiation Damage Models for Irradiated Silicon Sensors Using TCAD Tools}
por: Bhardwaj, Ashutosh, et al.
Publicado: (2014)