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Precision measurement of the form factors of semileptonic charged kaon decays from NA48/2
We present a measurement of the charged kaon semileptonic form factors based on 4.3 million $K^± → π^0 e^± \nu_e$ and 2.9 million $K^± → π^0 μ^± \nu_μ$ decays collectedby the NA48/2 experiment. The single results for the semi-electronic and semi-muonic channel have better and similar precision, resp...
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Lenguaje: | eng |
Publicado: |
2018
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2706420 |
Sumario: | We present a measurement of the charged kaon semileptonic form factors based on 4.3 million $K^± → π^0 e^± \nu_e$ and 2.9 million $K^± → π^0 μ^± \nu_μ$ decays collectedby the NA48/2 experiment. The single results for the semi-electronic and semi-muonic channel have better and similar precision, respectively, than previousmeasurements. The combination of both channels yields the most precisemeasurement of the form factors of semileptonic kaon decays. |
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