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Single Event Effect Testing With Ultrahigh Energy Heavy Ion Beams
Single event effect (SEE) testing with ultrahigh energy (UHE) heavy ions, such as the beams provided at CERN, presents advantages related to their long ranges with a constant linear energy transfer value. In the present work, the possibility to test components in parallel is being examined, and resu...
Autores principales: | , , , , , , , , , , , , , , |
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Lenguaje: | eng |
Publicado: |
2019
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1109/TNS.2019.2961801 http://cds.cern.ch/record/2757336 |
Sumario: | Single event effect (SEE) testing with ultrahigh energy (UHE) heavy ions, such as the beams provided at CERN, presents advantages related to their long ranges with a constant linear energy transfer value. In the present work, the possibility to test components in parallel is being examined, and results from the CERN 2018 UHE Pb test campaigns are studied. Furthermore, the generation of multibit upsets by the UHE Pb ions is evaluated, and the contribution of possible fragments to the SEE measurements is discussed. |
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