Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate

We investigate, through measurements and simulations, the possible direct ionization impact on the accelerator soft-error rate (SER), not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the-art commercial components considered in the 65–16-nm techn...

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Detalles Bibliográficos
Autores principales: García Alía, Rubén, Tali, Maris, Brugger, Markus, Cecchetto, Matteo, Cerutti, Francesco, Cononetti, Andrea, Danzeca, Salvatore, Esposito, Luigi, Fernández-Martínez, Pablo, Gilardoni, Simone, Infantino, Angelo, Kastriotou, Maria, Kerboub, Nourdine, Lerner, Giuseppe, Wyrwoll, Vanessa, Ferlet-Cavrois, Véronique, Boatella, César, Javanainen, Arto, Kettunen, Heikki, Morilla, Yolanda, Martín-Holgado, Pedro, Gaillard, Rémi, Wrobel, Frédéric, Cazzaniga, Carlo, Alexandrescu, Dan, Glorieux, Maximilien, Puchner, Helmut
Lenguaje:eng
Publicado: 2019
Materias:
Accelerators and Storage Rings
Acceso en línea:https://dx.doi.org/10.1109/TNS.2019.2951307
http://cds.cern.ch/record/2715468
Descripción
Sumario:We investigate, through measurements and simulations, the possible direct ionization impact on the accelerator soft-error rate (SER), not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the-art commercial components considered in the 65–16-nm technological range, indirect ionization is still expected to dominate the overall SER in the accelerator mixed-field. However, the derived critical charges of the most sensitive parts, corresponding to ~0.7 fC, are expected to be at the limit of rapid direct ionization dominance and soft-error increase.

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