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Investigation on the Sensitivity Degradation of Dosimeters based on Floating Gate Structure

Dosimeters based on floating gate structure exhibit a linear radiation response, whose sensitivity is required to be highly stable in order to achieve an accurate dose measurement. The understanding of the mechanisms behind the sensitivity degradation is, therefore, a fundamental task in order to im...

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Autores principales: Brucoli, M, Danzeca, S, Cesari, J, Brugger, M, Masi, A, Gilardoni, S, Pineda, A, Dusseau, L, Wrobel, F
Lenguaje:eng
Publicado: 2017
Acceso en línea:https://dx.doi.org/10.1109/RADECS.2017.8696191
http://cds.cern.ch/record/2713618
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author Brucoli, M
Danzeca, S
Cesari, J
Brugger, M
Masi, A
Gilardoni, S
Pineda, A
Dusseau, L
Wrobel, F
author_facet Brucoli, M
Danzeca, S
Cesari, J
Brugger, M
Masi, A
Gilardoni, S
Pineda, A
Dusseau, L
Wrobel, F
author_sort Brucoli, M
collection CERN
description Dosimeters based on floating gate structure exhibit a linear radiation response, whose sensitivity is required to be highly stable in order to achieve an accurate dose measurement. The understanding of the mechanisms behind the sensitivity degradation is, therefore, a fundamental task in order to improve the design of these devices. In this work, the causes of the loss of sensitivity are analyzed. The role of the injection rate and the reading MOS on are discussed in detail, by analyzing the results of radiation experiments specifically performed. The study sheds light on the importance of the choice of the amplitude of the linear range and the indirect effect of high dose rates. In addition, the TID lifetime of the core floating gate sensor is pointed out.
id oai-inspirehep.net-1783499
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
record_format invenio
spelling oai-inspirehep.net-17834992020-03-26T14:27:44Zdoi:10.1109/RADECS.2017.8696191http://cds.cern.ch/record/2713618engBrucoli, MDanzeca, SCesari, JBrugger, MMasi, AGilardoni, SPineda, ADusseau, LWrobel, FInvestigation on the Sensitivity Degradation of Dosimeters based on Floating Gate StructureDosimeters based on floating gate structure exhibit a linear radiation response, whose sensitivity is required to be highly stable in order to achieve an accurate dose measurement. The understanding of the mechanisms behind the sensitivity degradation is, therefore, a fundamental task in order to improve the design of these devices. In this work, the causes of the loss of sensitivity are analyzed. The role of the injection rate and the reading MOS on are discussed in detail, by analyzing the results of radiation experiments specifically performed. The study sheds light on the importance of the choice of the amplitude of the linear range and the indirect effect of high dose rates. In addition, the TID lifetime of the core floating gate sensor is pointed out.oai:inspirehep.net:17834992017
spellingShingle Brucoli, M
Danzeca, S
Cesari, J
Brugger, M
Masi, A
Gilardoni, S
Pineda, A
Dusseau, L
Wrobel, F
Investigation on the Sensitivity Degradation of Dosimeters based on Floating Gate Structure
title Investigation on the Sensitivity Degradation of Dosimeters based on Floating Gate Structure
title_full Investigation on the Sensitivity Degradation of Dosimeters based on Floating Gate Structure
title_fullStr Investigation on the Sensitivity Degradation of Dosimeters based on Floating Gate Structure
title_full_unstemmed Investigation on the Sensitivity Degradation of Dosimeters based on Floating Gate Structure
title_short Investigation on the Sensitivity Degradation of Dosimeters based on Floating Gate Structure
title_sort investigation on the sensitivity degradation of dosimeters based on floating gate structure
url https://dx.doi.org/10.1109/RADECS.2017.8696191
http://cds.cern.ch/record/2713618
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