Development of CMOS sensors for electron microscopy

In this work, we show the design and preliminary characterization of an image sensor with 64x64 pixels and its associated hardware and software needed to use the chip. The aim of the chip is to be used as a sensor for TEM electron microscopy. First measurements were done using X-Rays to characterize...

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Detalles Bibliográficos
Autores principales: Mateos, H, Ferretti, A, Mele, L, Perić, I
Lenguaje:eng
Publicado: 2019
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/14/12/c12002
http://cds.cern.ch/record/2713623
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author Mateos, H
Ferretti, A
Mele, L
Perić, I
author_facet Mateos, H
Ferretti, A
Mele, L
Perić, I
author_sort Mateos, H
collection CERN
description In this work, we show the design and preliminary characterization of an image sensor with 64x64 pixels and its associated hardware and software needed to use the chip. The aim of the chip is to be used as a sensor for TEM electron microscopy. First measurements were done using X-Rays to characterize the chip and to test the whole system (ASIC, Software, and Hardware). The chip was tested with electrons inside an Electron Microscope at Thermo Fisher and it’s functioning was checked. The chip was able to stand 50 Mrad of X-Ray and 3.6 Mrad of electrons total dose without decreasing considerably the performance.
id oai-inspirehep.net-1785113
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2019
record_format invenio
spelling oai-inspirehep.net-17851132020-03-26T14:05:55Zdoi:10.1088/1748-0221/14/12/c12002http://cds.cern.ch/record/2713623engMateos, HFerretti, AMele, LPerić, IDevelopment of CMOS sensors for electron microscopyDetectors and Experimental TechniquesIn this work, we show the design and preliminary characterization of an image sensor with 64x64 pixels and its associated hardware and software needed to use the chip. The aim of the chip is to be used as a sensor for TEM electron microscopy. First measurements were done using X-Rays to characterize the chip and to test the whole system (ASIC, Software, and Hardware). The chip was tested with electrons inside an Electron Microscope at Thermo Fisher and it’s functioning was checked. The chip was able to stand 50 Mrad of X-Ray and 3.6 Mrad of electrons total dose without decreasing considerably the performance.oai:inspirehep.net:17851132019
spellingShingle Detectors and Experimental Techniques
Mateos, H
Ferretti, A
Mele, L
Perić, I
Development of CMOS sensors for electron microscopy
title Development of CMOS sensors for electron microscopy
title_full Development of CMOS sensors for electron microscopy
title_fullStr Development of CMOS sensors for electron microscopy
title_full_unstemmed Development of CMOS sensors for electron microscopy
title_short Development of CMOS sensors for electron microscopy
title_sort development of cmos sensors for electron microscopy
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1088/1748-0221/14/12/c12002
http://cds.cern.ch/record/2713623
work_keys_str_mv AT mateosh developmentofcmossensorsforelectronmicroscopy
AT ferrettia developmentofcmossensorsforelectronmicroscopy
AT melel developmentofcmossensorsforelectronmicroscopy
AT perici developmentofcmossensorsforelectronmicroscopy

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