RD53A chip susceptibility to electromagnetic conducted noise

The RD53A read-out chip (65 nm CMOS) is a large-scale demonstrator for ATLAS and CMS phase 2 pixel upgrades. It is one of the key elements of the serial powering scheme for the next generation of pixel detectors. The susceptibility of the RD53A chip with respect to external EM noise has an impact on...

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Detalles Bibliográficos
Autores principales: Pradas, Alvaro, Arteche, Fernando, Esteban, Cristina, Arcega, Francisco Javier, Jiménez, Esther, Koukola, Dominik, Orfanelli, Stella, Christiansen, Jorgen
Lenguaje:eng
Publicado: SISSA 2020
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.22323/1.370.0064
http://cds.cern.ch/record/2724960
Descripción
Sumario:The RD53A read-out chip (65 nm CMOS) is a large-scale demonstrator for ATLAS and CMS phase 2 pixel upgrades. It is one of the key elements of the serial powering scheme for the next generation of pixel detectors. The susceptibility of the RD53A chip with respect to external EM noise has an impact on the integration strategies (grounding and shielding schemes) and operating conditions of future Pixel detectors. This paper presents a detailed analysis of the RD53A chip susceptibility to RF conducted disturbances in order to understand and address noise issues of RD53A Chip before the pixel upgrade installation.

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